- Type: Assembled Tester
- Display: 1.8inch 160*128 LCD
- Input Voltage: DC 6.8V-12V
- Operating Current: about 30mA, measured when inputting 7.5V DC voltage
Description:
This is a multi-functional transistor tester for automatic detection of NPN and PNP transistors, N channel, P channel, MOSFET and JFET, diodes, dual diode, thyristor, and automatic identification of the transistor pinout. It also can be used for frequency measurement and PWM signal generator.
Specifications:
- Type: Assembled Tester
- Display: 1.8inch 160*128 LCD
- Input Voltage: DC 6.8V-12V
- Operating Current: about 30mA, measured when inputting 7.5V DC voltage
- Resistance Measurement: Max. 50MΩ
- Resistance Resolution: 0.01Ω
- Capacitance Measurement: 25pF~100mF
- Capacitance Resolution: 1pF
Features:
- The processor uses a high-performance single-chip ATMEAG328P DIP-28. With IC seat
- The display unit uses a 160×128 pixel color display, the whole screen character number is 8×20, the color depth is 16 bits, graphics display component symbol
- Rotary code switch control, one-button measurement, automatic shutdown
- Powered by a 9V laminated battery, it can also be powered by a power adapter. The current is about 30mA, and the current is about 20nA after the shutdown
- Automatic detection of NPN and PNP transistors, FETs, diodes, dual diodes, thyristors, thyristors, automatic identification of the above transistor pin distribution
- Test NPN and PNP triode common-emitter current amplification factor, base-emitter threshold voltage, collector-emitter leakage current at the turn-off
- Identification of Darlington transistors through triode base-emitter threshold voltage and high current amplification factor.
- Detect power diodes and FET built-in protection diodes
- Test FET gate-source turn-on threshold voltage, drain-source on-resistance, gate-source capacitance
Package Included:
- 1 x GM328 Transistor Tester
- 1 x Acrylic Case